IOP, CAS, A06 Group

Ultrafast Transmission Electron Microscope (UTEM)

Based on a commercial TEM, the electron gun and sample chamber are modified. Femtosecond laser pulses are introduced to the gun (generating photoelectrons) and sample (for excitation). Using a pump-probe method with a high-sensitivity CCD, we can acquire ultrafast diffraction, imaging, and EELS data.
Equipped with various in-situ sample holders for high/low temperatures, allowing easy adjustment of conditions like tilting, rotation, heating, and cooling.
The system achieves a temporal resolution of 400 fs and a spatial resolution of 0.3 nm.
Ideal for studying ultrafast processes like lattice dynamics, phase transitions, charge/orbital order melting, chemical reaction intermediates, and non-equilibrium dynamics.

The JEM-2100F's field-emission gun (FEG) provides a high-brightness, high-coherence, and stable electron beam, facilitating nano-scale ultra-high-resolution observation and analysis.
The high-stability FEG simplifies high-magnification structural analysis. The spot size can be adjusted from micrometers down to a minimum of 0.5 nm.
A modern side-entry goniometer stage allows for easy adjustment of sample conditions like tilting, rotation, heating, and cooling for nano-scale analysis.
Features an integrated design for seamless image observation and PC-based control.

Excellent imaging at low accelerating voltages, with a resolution of 1.3 nm at 1 kV.
Allows for direct observation of non-conductive samples without the need for coating.
The upper detector can capture either secondary electron or back-scattered electron images.
Provides a large depth of field, creating clear three-dimensional image effects.
The deceleration function can be enabled or disabled based on the sample and observation requirements.
Can perform elemental distribution analysis using an X-ray energy-dispersive spectrometer (EDXS).

$X-ray Diffractometer$

The X-ray source uses a Cu target (Kα line) with a Ni filter.
Utilizes a LYNXEYE position-sensitive detector for high data acquisition efficiency, enhancing signal intensity and significantly reducing collection time.
Equipped with three sample stages: a standard stage, a rotation stage, and an Anton Paar TTK-830 in-situ high/low-temperature stage.
The TTK-830 stage allows for in-situ measurements by cooling or heating the sample in an inert gas or vacuum, covering a temperature range of 100K to 700K.

Solved the challenge of high spatiotemporal resolution imaging at the atomic scale, creating the world's first ultrafast aberration-corrected transmission electron microscope.
Achieved internationally leading specifications with a temporal resolution of 350 fs, a spatial resolution of 3Å, and an energy resolution of 1.0 eV.
Combines ultrafast laser pump-probe methods with integrated high-resolution imaging, diffraction, and spectroscopy techniques.
Capable of capturing the motion of atoms in materials on the femtosecond timescale, and has already yielded original results in cutting-edge research such as hidden quantum states and metal laser accelerators.